Structure of 3 at.% and 9 at.% Si-doped HfO 2 from combined refinement of X-ray and neutron diffraction patterns
Journal article published in 2015 by
Lili Zhao,
Dong Hou 
,
Tedi-Marie Usher,
Thanakorn Iamsasri,
Chris M. Fancher,
Jennifer S. Forrester,
Toshikazu Nishida,
Saeed Moghaddam,
Jacob L. Jones
,
Tedi-Marie Usher,
Thanakorn Iamsasri,
Chris M. Fancher,
Jennifer S. Forrester,
Toshikazu Nishida,
Saeed Moghaddam,
Jacob L. Jones
