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Published in

IOP Publishing, New Journal of Physics, 2(11), p. 023039, 2009

DOI: 10.1088/1367-2630/11/2/023039

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Reactive sputter deposition of TiNxfilms, simulated with a particle-in-cell/Monte Carlo collisions model

Journal article published in 2009 by E. Bultinck, S. Mahieu, D. Depla, A. Bogaerts ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

The physical processes in an Ar/N-2 magnetron discharge used for the reactive sputter deposition of TiNx thin films were simulated with a 2d3v particle-in-cell/Monte Carlo collisions (PIC)/MCC) model. Cathode currents and voltages were calculated self-consistently and compared with experiments. Also, ion fractions were calculated and validated with mass spectrometric measurements. With this PIC/MCC model, the influence of N-2/Ar gas ratio on the particle densities and fluxes was investigated, taking into account the effect of the poisoned state of the target.