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Institute of Electrical and Electronics Engineers, IEEE Access, (9), p. 22587-22594, 2021

DOI: 10.1109/access.2021.3056151

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Research on Negative Bias Temperature Instability Effects under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs

Journal article published in 2021 by Chao Peng ORCID, Rui Gao ORCID, Zhifeng Lei, Zhangang Zhang ORCID, Yiqiang Chen ORCID, Yunfei En ORCID, Yun Huang
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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