Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Software Engineering, 7(48), p. 2189-2207, 2022
Links
Tools
DEFECTCHECKER: Automated Smart Contract Defect Detection by Analyzing EVM Bytecode
Journal article published in 2021 by
Jiachi Chen 
,
Xin Xia ,
David Lo ,
John Grundy ,
Xiapu Luo ,
Ting Chen
,
Xin Xia ,
David Lo ,
John Grundy ,
Xiapu Luo ,
Ting Chen
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 