Published in
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), 2019
DOI: 10.23919/emcsapporo/apemc44270.2019.9320849
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Characterization of EM faults on ATmega328p
Proceedings article published in 2019 by
Arthur Beckers 
,
Josep Balasch,
Benedikt Gierlichs,
Ingrid Verbauwhede,
Saki Osuka,
Masahiro Kinugawa,
Daisuke Fujimoto,
Yuichi Hayashi
,
Josep Balasch,
Benedikt Gierlichs,
Ingrid Verbauwhede,
Saki Osuka,
Masahiro Kinugawa,
Daisuke Fujimoto,
Yuichi Hayashi
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