Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 4(68), p. 2098-2106, 2021
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Impact of the Nonlinear Dielectric Hysteresis Properties of a Charge Trap Layer in a Novel Hybrid High-Speed and Low-Power Ferroelectric or Antiferroelectric HSO/HZO Boosted Charge Trap Memory
Journal article published in 2021 by
Tarek Ali 
,
Konstantin Mertens,
Ricardo Olivo,
Matthias Rudolph,
Sebastian Oehler,
Kati Kuhnel,
David Lehninger,
Franz Muller ,
Raik Hoffmann,
Philipp Schramm,
Kati Biedermann,
Joachim Metzger,
Robert Binder,
Malte Czernohorsky,
Thomas Kampfe
and other authors.
,
Konstantin Mertens,
Ricardo Olivo,
Matthias Rudolph,
Sebastian Oehler,
Kati Kuhnel,
David Lehninger,
Franz Muller ,
Raik Hoffmann,
Philipp Schramm,
Kati Biedermann,
Joachim Metzger,
Robert Binder,
Malte Czernohorsky,
Thomas Kampfe
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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