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MDPI, Nanomaterials, 2(11), p. 257, 2021

DOI: 10.3390/nano11020257

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Chemically Roughened, Sputtered Au Films with Trace-Loaded Manganese Oxide for both On-Chip and Off-Chip High Frequency Supercapacitors

Journal article published in 2021 by Pai Lu, Haitao Xue, Wentao Liu, Zhongbao Feng, Qiang Sun
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

High frequency supercapacitors (HFSCs) are promising in alternating current line filtering and adaptable storage of high-frequency pulse electrical energy. Herein, we report a facile yet integrated-circuit-compatible fabrication of HFSC electrodes by combining chemical roughening of the sputtered metal (Au) films and in situ trace loading of a pseudocapacitive material (MnOx). The developed electrode fabrication route is versatile for different substrates, and is described with the application paradigms of both on-chip (with Si/SiO2 substrate) and off-chip (without Si/SiO2 substrate, with Ti substrate as an example in this study) HFSCs. With Au/MnOx films on Si/SiO2 substrates as the working electrodes, the derived on-chip HFSC displayed satisfactory performance in high frequency applications (i.e., an areal capacitance of 131.7 µF cm−2, a phase angle of −78°, and a RC time constant of 0.27 ms, at 120 Hz).