Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 3(68), p. 1024-1030, 2021
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Impact of the Ohmic Electrode on the Endurance of Oxide-Based Resistive Switching Memory
Journal article published in 2021 by
Stefan Wiefels 
,
Moritz von Witzleben,
Michael Huttemann,
Ulrich Bottger,
Rainer Waser ,
Stephan Menzel
,
Moritz von Witzleben,
Michael Huttemann,
Ulrich Bottger,
Rainer Waser ,
Stephan Menzel
This paper was not found in any repository, but could be made available legally by the author.
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