Published in
2020 IEEE International Integrated Reliability Workshop (IIRW), 2020
DOI: 10.1109/iirw49815.2020.9312851
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Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs
Proceedings article published in 2020 by
Yannick Raffel,
Maximilian Lederer,
Ricardo Olivo,
Franz Muller 
,
Raik Hoffmann,
Tarek Ali,
Thomas Kampfe,
Konrad Seidel,
Johannes Heitmann
,
Raik Hoffmann,
Tarek Ali,
Thomas Kampfe,
Konrad Seidel,
Johannes Heitmann
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