Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 2(42), p. 204-207, 2021
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Drain Current Density Over 1.1 A/mm in 2D Hole Gas Diamond MOSFETs with Regrown p++-Diamond Ohmic Contacts
Journal article published in 2020 by
Shoichiro Imanishi 
,
Ken Kudara,
Hitoshi Ishiwata ,
Kiyotaka Horikawa,
Shotaro Amano,
Masayuki Iwataki ,
Aoi Morishita,
Atsushi Hiraiwa ,
Hiroshi Kawarada
,
Ken Kudara,
Hitoshi Ishiwata ,
Kiyotaka Horikawa,
Shotaro Amano,
Masayuki Iwataki ,
Aoi Morishita,
Atsushi Hiraiwa ,
Hiroshi Kawarada
This paper was not found in any repository, but could be made available legally by the author.
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