Published in
Elsevier, Materialia, (14), p. 100953, 2020
DOI: 10.1016/j.mtla.2020.100953
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Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods
Journal article published in 2020 by
A. Borzì 
,
S. Dolabella ,
W. Szmyt ,
J. Geler-Kremer,
S. Abel,
J. Fompeyrine ,
P. Hoffmann,
A. Neels
,
S. Dolabella ,
W. Szmyt ,
J. Geler-Kremer,
S. Abel,
J. Fompeyrine ,
P. Hoffmann,
A. Neels
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