Published in

2020 International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), 2020

DOI: 10.1109/iwem49354.2020.9237414

Links

Tools

Export citation

Search in Google Scholar

Time domain Near-Field Measurement Technology and Simulation for System Level ESD Testing

Proceedings article published in 2020 by Cheng-Tao Li, Che-Yu Liu, Sung-Mao Wu, Sheng-Wei Guan, Ming-Shan Lin, Chia-Hung Su
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Green circle
Postprint: archiving allowed
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO