Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 12(67), p. 5374-5380, 2020
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Process Variation Analysis of Device Performance Using Virtual Fabrication: Methodology Demonstrated on a CMOS 14-nm FinFET Vehicle
Journal article published in 2020 by
Benjamin Vincent 
,
Raghu Hathwar,
Mattan Kamon,
Joseph Ervin,
Tom Schram ,
Thomas Chiarella,
Steven Demuynck,
Sylvain Baudot,
Yong Kong Siew,
Stenfan Kubicek,
Eugenio Dentoni Litta ,
SoonAik Chew,
Jerome Mitard
,
Raghu Hathwar,
Mattan Kamon,
Joseph Ervin,
Tom Schram ,
Thomas Chiarella,
Steven Demuynck,
Sylvain Baudot,
Yong Kong Siew,
Stenfan Kubicek,
Eugenio Dentoni Litta ,
SoonAik Chew,
Jerome Mitard
This paper was not found in any repository, but could be made available legally by the author.
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