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American Institute of Physics, Journal of Applied Physics, 13(128), p. 131101, 2020

DOI: 10.1063/5.0020239

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Thermoreflectance techniques and Raman thermometry for thermal property characterization of nanostructures

Journal article published in 2020 by Emigdio Chávez-Ángel ORCID, Susanne Sandell ORCID, Alexandros El Sachat ORCID, Alexandros El Sachat, Clivia M. Sotomayor Torres ORCID, Jianying He ORCID, Jeremie Maire ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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