Published in
Korean Nuclear Society, Nuclear Engineering and Technology, 4(53), p. 1297-1303, 2021
DOI: 10.1016/j.net.2020.09.018
Links
Tools
Calibration-free real-time organic film thickness monitoring technique by reflected X-Ray fluorescence and compton scattering measurement
Journal article published in 2020 by
Junghwan Park,
Yong Suk Choi,
Junhyuck Kim,
Jeongmook Lee,
Tae Jun Kim 
,
Young-Sang Youn ,
Sang Ho Lim,
Jong-Yun Kim
,
Young-Sang Youn ,
Sang Ho Lim,
Jong-Yun Kim
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
Full text: Unavailable
Data provided by 