Published in

American Institute of Physics, Journal of Vacuum Science and Technology A, 6(38), p. 063203, 2020

DOI: 10.1116/6.0000359

Links

Tools

Export citation

Search in Google Scholar

Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities

Journal article published in 2020 by Mark H. Engelhard ORCID, Donald R. Baer ORCID, Alberto Herrera-Gomez ORCID, Peter M. A. Sherwood ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Upload
Green circle
Postprint: archiving allowed
Upload
Orange circle
Published version: archiving restricted
Upload
Policy details
Data provided by SHERPA/RoMEO