Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 11(67), p. 4667-4671, 2020
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Charge-Based Model for the Drain-Current Variability in Organic Thin-Film Transistors Due to Carrier-Number and Correlated- Mobility Fluctuation
Journal article published in 2020 by
Aristeidis Nikolaou 
,
Ghader Darbandy ,
Jakob Leise ,
Jakob Pruefer ,
James W. Borchert ,
Michael Geiger,
Hagen Klauk ,
Benjamin Iniguez ,
Alexander Kloes
,
Ghader Darbandy ,
Jakob Leise ,
Jakob Pruefer ,
James W. Borchert ,
Michael Geiger,
Hagen Klauk ,
Benjamin Iniguez ,
Alexander Kloes
This paper was not found in any repository, but could be made available legally by the author.
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