Published in
Advances in Metrology for X-Ray and EUV Optics IX, 2020
DOI: 10.1117/12.2569135
Links
Tools
Single-shot speckle tracking method based on wavelet transform and multi-resolution analysis
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Preprint: archiving forbidden
Data provided by 