Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 10(67), p. 3954-3959, 2020
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Trapping and Detrapping Mechanisms in β-Ga₂O₃ Vertical FinFETs Investigated by Electro-Optical Measurements
Journal article published in 2020 by
Elena Fabris 
,
Carlo De Santi ,
Alessandro Caria ,
Wenshen Li ,
Kazuki Nomoto,
Zongyang Hu ,
Debdeep Jena ,
Huili Grace Xing ,
Gaudenzio Meneghesso ,
Enrico Zanoni,
Matteo Meneghini
,
Carlo De Santi ,
Alessandro Caria ,
Wenshen Li ,
Kazuki Nomoto,
Zongyang Hu ,
Debdeep Jena ,
Huili Grace Xing ,
Gaudenzio Meneghesso ,
Enrico Zanoni,
Matteo Meneghini
This paper is made freely available by the publisher.
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