Published in
American Chemical Society, Crystal Growth and Design, 8(20), p. 5269-5276, 2020
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Simultaneous monitoring of molecular thin film morphology and crystal structure by X-ray scattering
Journal article published in 2020 by
Nada Mrkyvkova 
,
Peter Nadazdy,
Martin Hodas ,
Jianwei Chai,
Shijie Wang,
Dongzhi Chi ,
Michaela Sojkova ,
Martin Hulman ,
Andrei Chumakov,
Oleg V. Konovalov,
Alexander Hinderhofer ,
Matej Jergel ,
Eva Majkova ,
Peter Siffalovic ,
Frank Schreiber
,
Peter Nadazdy,
Martin Hodas ,
Jianwei Chai,
Shijie Wang,
Dongzhi Chi ,
Michaela Sojkova ,
Martin Hulman ,
Andrei Chumakov,
Oleg V. Konovalov,
Alexander Hinderhofer ,
Matej Jergel ,
Eva Majkova ,
Peter Siffalovic ,
Frank Schreiber
This paper was not found in any repository, but could be made available legally by the author.
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- Must obtain written permission from Editor
- Must not violate ACS ethical Guidelines
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