Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 7(67), p. 2981-2987, 2020
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A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: Pyroelectricity and Reliability
Journal article published in 2020 by
T. Ali 
,
K. Kuhnel,
M. Czernohorsky,
C. Mart ,
M. Rudolph,
B. Patzold,
D. Lehninger,
R. Olivo,
M. Lederer ,
F. Muller ,
R. Hoffmann,
J. Metzger,
R. Binder,
P. Steinke,
T. Kampfe
and other authors.
,
K. Kuhnel,
M. Czernohorsky,
C. Mart ,
M. Rudolph,
B. Patzold,
D. Lehninger,
R. Olivo,
M. Lederer ,
F. Muller ,
R. Hoffmann,
J. Metzger,
R. Binder,
P. Steinke,
T. Kampfe
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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