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Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 7(67), p. 2793-2799, 2020

DOI: 10.1109/ted.2020.2996582

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A Study on the Temperature-Dependent Operation of Fluorite-Structure-Based Ferroelectric HfO2 Memory FeFET: A Temperature-Modulated Operation

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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