Published in
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2020
DOI: 10.23919/date48585.2020.9116558
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RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
Proceedings article published in 2020 by
M. Jenihhin,
S. Hamdioui,
M. Sonza Reorda,
M. Sonza Reorda,
M. Krstic 
,
P. Langendorfer,
C. Sauer,
A. Klotz,
M. Huebner,
J. Nolte,
H. T. Vierhaus,
G. Selimis,
D. Alexandrescu,
M. Taouil,
G. J. Schrijen
and other authors.
,
P. Langendorfer,
C. Sauer,
A. Klotz,
M. Huebner,
J. Nolte,
H. T. Vierhaus,
G. Selimis,
D. Alexandrescu,
M. Taouil,
G. J. Schrijen
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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