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Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 10(67), p. 3978-3982, 2020

DOI: 10.1109/ted.2020.2993192

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Impact of Residual Carbon on Avalanche Voltage and Stability of Polarization-Induced Vertical GaN p-n Junction

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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