Published in
American Institute of Physics, Review of Scientific Instruments, 6(91), p. 064903, 2020
DOI: 10.1063/5.0003770
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Accurate measurement of in-plane thermal conductivity of layered materials without metal film transducer using frequency domain thermoreflectance
Journal article published in 2020 by
Xin Qian 
,
Zhiwei Ding,
Jungwoo Shin ,
Aaron J. Schmidt ,
Gang Chen
,
Zhiwei Ding,
Jungwoo Shin ,
Aaron J. Schmidt ,
Gang Chen
This paper was not found in any repository, but could be made available legally by the author.
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