Published in
Wiley, Surface and Interface Analysis, 12(52), p. 802-810, 2020
DOI: 10.1002/sia.6790
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Concepts for chemical state analysis at constant probing depth by lab‐based XPS/HAXPES combining soft and hard X‐ray sources
Journal article published in 2020 by
Sebastian Siol 
,
Jennifer Mann,
John Newman,
Takuya Miyayama,
Katsumi Watanabe,
Patrik Schmutz ,
Claudia Cancellieri,
Lars P. H. Jeurgens
,
Jennifer Mann,
John Newman,
Takuya Miyayama,
Katsumi Watanabe,
Patrik Schmutz ,
Claudia Cancellieri,
Lars P. H. Jeurgens
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