Published in
IOP Publishing, Superconductor Science and Technology, 7(33), p. 07LT02, 2020
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Characterization of sputtered hafnium thin films for high quality factor microwave kinetic inductance detectors
Journal article published in 2020 by
Gregoire Coiffard 
,
Miguel Daal,
Nicholas Zobrist,
Noah Swimmer,
Sarah Steiger ,
Bruce Bumble,
Benjamin A. Mazin
,
Miguel Daal,
Nicholas Zobrist,
Noah Swimmer,
Sarah Steiger ,
Bruce Bumble,
Benjamin A. Mazin
This paper is made freely available by the publisher.
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