Published in
Noise in Nanoscale Semiconductor Devices, p. 33-85, 2020
DOI: 10.1007/978-3-030-37500-3_2
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Noise and Fluctuations in Fully Depleted Silicon-on-Insulator MOSFETs
Book chapter published in 2020 by
Christoforos Theodorou 
,
Gérard Ghibaudo
,
Gérard Ghibaudo
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