Published in
American Physical Society, Physical Review Applied, 4(13), 2020
DOI: 10.1103/physrevapplied.13.044062
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Atomic-Scale Insights into Semiconductor Heterostructures: From Experimental Three-Dimensional Analysis of the Interface to a Generalized Theory of Interfacial Roughness Scattering
Journal article published in 2020 by
T. Grange 
,
S. Mukherjee,
G. Capellini ,
M. Montanari ,
L. Persichetti ,
L. Di Gaspare ,
S. Birner ,
A. Attiaoui,
O. Moutanabbir ,
M. Virgilio,
M. De Seta
,
S. Mukherjee,
G. Capellini ,
M. Montanari ,
L. Persichetti ,
L. Di Gaspare ,
S. Birner ,
A. Attiaoui,
O. Moutanabbir ,
M. Virgilio,
M. De Seta
This paper was not found in any repository, but could be made available legally by the author.
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