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Wiley, physica status solidi (a) – applications and materials science, 7(217), p. 1900802, 2020

DOI: 10.1002/pssa.201900802

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High‐Temperature Operation of Al<sub>x</sub>Ga<sub>1−x</sub>N (x &gt; 0.4) Channel Metal Oxide Semiconductor Heterostructure Field Effect Transistors with High‐k Atomic Layer Deposited Gate Oxides

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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