Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Device and Materials Reliability, 2(20), p. 420-428, 2020
DOI: 10.1109/tdmr.2020.2986401
Links
Tools
Worst-Case Bias for High Voltage, Elevat-ed-Temperature Stress of AlGaN/GaN HEMTs
Journal article published in 2020 by
P. F. Wang 
,
X. Li,
E. X. Zhang ,
R. Jiang ,
M. W. McCurdy,
B. S. Poling,
E. R. Heller,
R. D. Schrimpf ,
D. M. Fleetwood
,
X. Li,
E. X. Zhang ,
R. Jiang ,
M. W. McCurdy,
B. S. Poling,
E. R. Heller,
R. D. Schrimpf ,
D. M. Fleetwood
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 