Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Microwave Theory and Techniques, 6(68), p. 2116-2123, 2020
DOI: 10.1109/tmtt.2020.2982396
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High-Frequency Noise Characterization and Modeling of Graphene Field-Effect Transistors
Journal article published in 2020 by
Marina Deng 
,
Dalal Fadil,
Wei Wei,
Emiliano Pallecchi,
Henri Happy ,
Gilles Dambrine,
Magali De Matos ,
Thomas Zimmer ,
Sebastien Fregonese
,
Dalal Fadil,
Wei Wei,
Emiliano Pallecchi,
Henri Happy ,
Gilles Dambrine,
Magali De Matos ,
Thomas Zimmer ,
Sebastien Fregonese
This paper was not found in any repository, but could be made available legally by the author.
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