Published in
Springer, Journal of Electronic Testing, 1(36), p. 47-57, 2019
DOI: 10.1007/s10836-019-05846-4
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Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems
Journal article published in 2019 by
Alejandro Serrano-Cases,
Felipe Restrepo-Calle,
Sergio Cuenca-Asensi,
Antonio Martínez-Álvarez 
This paper is made freely available by the publisher.
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