Published in
Elsevier, Microelectronics Reliability, (100-101), p. 113341, 2019
DOI: 10.1016/j.microrel.2019.06.033
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Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
Journal article published in 2019 by
Roger Goerl,
Paulo Villa,
Fabian L. Vargas,
César A. Marcon 
,
Nilberto H. Medina ,
Nemitala Added,
Marcilei A. Guazzelli
,
Nilberto H. Medina ,
Nemitala Added,
Marcilei A. Guazzelli
This paper was not found in any repository, but could be made available legally by the author.
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