Charge trapping and degradation of Ga2O3 isolation structures for power electronics
Proceedings article published in 2020 by
Carlo De Santi,
Arianna Nardo,
Man Hoi Wong,
Ken Goto,
Akito Kuramata,
Shigenobu Yamakoshi,
Hisashi Murakami,
Yoshinao Kumagai,
Masataka Higashiwaki 
,
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini
,
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini
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