Institute of Electrical and Electronics Engineers, IEEE Transactions on Power Electronics, 5(30), p. 2405-2412, 2015
DOI: 10.1109/tpel.2014.2344174
Full text: Download
Four-point probing of electrical parameters on various components of IGBT modules is suggested as an approach for the estimation of degradation in stressed devices. By comparison of these parameters for stressed and new components one can evaluate an overall degradation of the module and find out the wear state of individual components. This knowledge can be applied for preventing early failures and for optimization of the device design. The method is presented by regarding a standard type power module subjected to power cycling.