Published in

Rsc, Materials Horizons, 3(7), p. 787-795, 2020

DOI: 10.1039/c9mh01866b

Links

Tools

Export citation

Search in Google Scholar

Post-assembly dimension-dependent face-selective etching of fullerene crystals

This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

Full text: Unavailable

Question mark in circle
Preprint: policy unknown
Question mark in circle
Postprint: policy unknown
Question mark in circle
Published version: policy unknown
Data provided by SHERPA/RoMEO

Abstract

Ethylene diamine potentially causes dimension-dependent face-selective chemical etching of fullerene crystals based on a post-assembly method.