Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Power Electronics, 5(35), p. 5205-5220, 2020
DOI: 10.1109/tpel.2019.2941480
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A Fast and Robust Diagnostic Method for Multiple Open-Circuit Faults of Voltage-Source Inverters Through Line Voltage Magnitudes Analysis
Journal article published in 2020 by
Xun Wu 
,
Chun-Yang Chen,
Te-Fang Chen,
Shu Cheng ,
Zhi-Hong Mao ,
Tian-Jian Yu ,
Kaidi Li
,
Chun-Yang Chen,
Te-Fang Chen,
Shu Cheng ,
Zhi-Hong Mao ,
Tian-Jian Yu ,
Kaidi Li
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