Published in
Elsevier, Microelectronics Journal, (96), p. 104683, 2020
DOI: 10.1016/j.mejo.2019.104683
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Double cell upsets mitigation through triple modular redundancy
Journal article published in 2020 by
Yuanqing Li,
Anselm Breitenreiter,
Marko Andjelkovic,
Junchao Chen,
Milan Babic,
Milos Krstic 
This paper was not found in any repository, but could be made available legally by the author.
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