Published in
Elsevier, Microelectronic Engineering, 4(88), p. 444-447
DOI: 10.1016/j.mee.2010.08.010
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Temperature and frequency characterization of InAs nanowire and HfO2 interface using capacitance-voltage method
Journal article published in 2011 by
Gvidas Astromskas,
Kristian Storm,
Philippe Caroff 
,
Magnus Borgström,
Erik Lind,
Lars-Erik Wernersson
,
Magnus Borgström,
Erik Lind,
Lars-Erik Wernersson
This paper was not found in any repository, but could be made available legally by the author.
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