Degradation and recovery of high-periodicity InGaN/GaN MQWs under optical stress in short-circuit condition
Proceedings article published in 2020 by
Alessandro Caria 
,
Carlo De Santi,
Filippo Zamperetti,
Xuanqi Huang,
Houqiang Fu,
Hong Chen,
Yuji Zhao,
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini
,
Carlo De Santi,
Filippo Zamperetti,
Xuanqi Huang,
Houqiang Fu,
Hong Chen,
Yuji Zhao,
Gaudenzio Meneghesso,
Enrico Zanoni,
Matteo Meneghini
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