Impact of Stacking Faults and Domain Boundaries on the Electronic Transport in Cubic Silicon Carbide Probed by Conductive Atomic Force Microscopy
Journal article published in 2020 by
Filippo Giannazzo 
,
Giuseppe Greco,
Salvatore Di Franco,
Patrick Fiorenza,
Ioannis Deretzis,
Antonino La Magna,
Corrado Bongiorno,
Massimo Zimbone ,
Francesco La Via,
Marcin Zielinski,
Fabrizio Roccaforte
,
Giuseppe Greco,
Salvatore Di Franco,
Patrick Fiorenza,
Ioannis Deretzis,
Antonino La Magna,
Corrado Bongiorno,
Massimo Zimbone ,
Francesco La Via,
Marcin Zielinski,
Fabrizio Roccaforte
This paper is made freely available by the publisher.
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