Published in
2020 IEEE 11th Latin American Symposium on Circuits & Systems (LASCAS), 2020
DOI: 10.1109/lascas45839.2020.9069026
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Reliability Evaluation of Compressed Deep Learning Models
Proceedings article published in 2020 by
Brunno F. Goldstein,
Sudarshan Srinivasan,
Dipankar Das,
Kunal Banerjee,
Leandro Santiago,
Victor C. Ferreira,
Alexandre S. Nery,
Sandip Kundu,
Felipe M. G. Franca 
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