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Elsevier, Materials Research Bulletin, 5(43), p. 1179-1187

DOI: 10.1016/j.materresbull.2007.05.032

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Preparation and characterization of germanium oxysulfide glassy films for optics

Journal article published in 2008 by Clément Maurel, Thierry Cardinal, Philippe Vinatier, Laëtitia Petit, Kathleen Richardson, N. Carlie, François Guillen, Michel Lahaye, Michel Couzi, Frédéric Adamietz, Vincent Rodriguez ORCID, François Lagugne-Labarthet, Virginie Nazabal, Arnaud Royon, Lionel Canioni
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This paper is available in a repository.

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Abstract

Homogeneous amorphous films in the GeS2-GeO2 system have been deposited by a rf sputtering technique. Optical characterizations have shown that the cut-off wavelength and the linear indices increase with an increase in the S/O ratio. Raman spectroscopy indicates the presence of new modes that can be assigned to intermediate germanium oxysulfide structural units. Photo-sensitivity of the oxysulfide films has been demonstrated for irradiation near the band-gap. Diffraction gratings inscribed using 488 nm exposure displayed a limited diffraction efficiency (≤3%) that weakens with a corresponding decrease in the glass S/O ratio.