Modulating the filament rupture degree of threshold switching device for self-selective and low-current nonvolatile memory application
Journal article published in 2020 by
Xiaolong Zhao,
Jiebin Niu,
Yang Yang,
Xiangheng Xiao 
,
Rui Chen,
Zuheng Wu,
Ying Zhang,
Hangbing Lv,
Shibing Long,
Qi Liu ,
Changzhong Jiang,
Ming Liu
,
Rui Chen,
Zuheng Wu,
Ying Zhang,
Hangbing Lv,
Shibing Long,
Qi Liu ,
Changzhong Jiang,
Ming Liu
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