Published in
Wiley, Advanced Materials, 44(24), p. OP309-OP313, 2012
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- [www.researchgate.net] | PDF
- [www.ncbi.nlm.nih.gov] | PDF
- [www.ncbi.nlm.nih.gov] | PDF
- [onlinelibrary.wiley.com] | PDF
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Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Ångström Emitter Localization
Journal article published in 2012 by
Dominik Wildanger,
Brian R. Patton 
,
Heiko Schill,
Luca Marseglia,
J. P. Hadden ,
Sebastian Knauer,
Andreas Schönle,
John G. Rarity,
Jeremy L. O'Brien,
Stefan W. Hell,
Jason M. Smith
,
Heiko Schill,
Luca Marseglia,
J. P. Hadden ,
Sebastian Knauer,
Andreas Schönle,
John G. Rarity,
Jeremy L. O'Brien,
Stefan W. Hell,
Jason M. Smith
This paper is available in a repository.
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Abstract
Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.