Published in
The Electrochemical Society, ECS Journal of Solid State Science and Technology, 2(8), p. P70-P76, 2019
DOI: 10.1149/2.0011902jss
Links
Tools
Defect Characterization of Multicycle Rapid Thermal Annealing Processed p-GaN for Vertical Power Devices
Journal article published in 2019 by
Yekan Wang 
,
Tingyu Bai,
Chao Li,
Marko J. Tadjer,
Travis J. Anderson,
Jennifer K. Hite ,
Michael A. Mastro,
Charles R. Eddy,
Karl D. Hobart,
Boris N. Feigelson,
Mark S. Goorsky
,
Tingyu Bai,
Chao Li,
Marko J. Tadjer,
Travis J. Anderson,
Jennifer K. Hite ,
Michael A. Mastro,
Charles R. Eddy,
Karl D. Hobart,
Boris N. Feigelson,
Mark S. Goorsky
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 