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Institute of Electrical and Electronics Engineers, IEEE Journal of the Electron Devices Society, (7), p. 483-488, 2019

DOI: 10.1109/jeds.2019.2910271

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Novel 10-nm Gate Length MoS2 Transistor Fabricated on Si Fin Substrate

This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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