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Back bias ramping and photoionization spectroscopy analysis of GaN-on-Si HFETs

Proceedings article published in 2016 by A. Pooth, T. Martin, Michael J. Uren ORCID, Martin Kuball
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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