IOP Publishing, Journal of Physics: Conference Series, 1(1410), p. 012228, 2019
DOI: 10.1088/1742-6596/1410/1/012228
Full text: Download
Abstract This work presents the results of an investigation of in plane horizontal GaAs nanowires by Scanning Probe Microscopy (SPM) methods. Topography and a local conductivity map of the horizontal nanowire with axial p-n junction are obtained. The distribution of doping and position of p-n junctions in nanowires are visualized. The I-V curves of differently doped parts of nanowires were measured. These data can be important for the understanding of the doping incorporation mechanism of GaAs nanowires.